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GEM-VIS Quality Control & Visualization
Software
 


 


GEM recently launched a new quality control / basic processing / visualization package designed with Encom Technology Pty. Ltd. – a leading innovator in specialist software or the geosciences.

GEM-VIS has been specifically developed to provide our customers as an end-to-end solution for working with GEM data in the field or office.

Easy Visualization, Processing and Mapping

 GEM-VIS serves as a quality control and /or visualization environment with an easy-to-use interface to more advanced 3D modeling tools. Specific capabilities include the ability to display and /or work with:

 • Survey paths
 • Line profiles
 • Simple processing (running average and Gaussian filtering)
 • 2D image maps
 • Contours
 • Stacked Profiles
 • Text items (legends, notes, titles)
 • Objects (Scalebars, North arrows)
 • 3D Plots and Surfaces 

Note that GEM-VIS is supported via a software manual only. Full support can be uptained by upgrading to the Profile Analyst software described below.


 For more information

GEM-VIZ is based on a software program called Profile Analyst (developed by Encom Technology Pty Ltd). The GEM-VIZ program uses only a small portion of the capabilities of Profile Analyst but has many of the best features of the software. GEM-VIS is upgradeable to a full version of Profile Analyst. For more information, contact GEM.

 To deliver a complete software solution as required by our customers, we also offer other software from a variety of providers.  For more information, please view our software page.
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